WebWe report construction of an iodine-stabilized laser frequency standard at 532 nm based on modulation transfer spectroscopy (MTS) technology with good reproducibility. WebThe estimated uncertainty budget at the wavelength 532 nm is given in Table 1. The frequency value found for the C-system agrees well with that earlier found for the B-system which is 563 260 223 510.8 kHz , u c =0.2 kHz ... M. L. Eickhoff, and J. L. Hall, "Optical Frequency Standard at 532 nm", IEEE Trans. Instrum. Meas., vol. 44, pp. 155-158 ...
Portable 532 nm Iodine-Stabilized DPSS Laser for Length Standard
WebJun 1, 2001 · A 532 nm molecular iodine optical frequency standard based on modulation transfer spectroscopy 2024, Chinese Physics B Progress Towards the Establishment of Various Redefinitions of SI Unit “Metre” at CSIR-National Physical Laboratory- India and its Realization 2024, Mapan - Journal of Metrology Society of India Webof the filter optical density. Ultra-low frequency Raman spectrum of SiGe superlattice at 532 nm with LabRAM HR Evolution and BragGrate Notch Filters (Courtesy of P.H. Tan, Institute of Semiconductors, CAS, Beijing, P.R. China) ... Transmission ripple: 1% at ±0.5 nm from laser line (@633 nm) Standard Parameters. Center Wavelength ... screenshot 194
Collinear opto-optical loss modulation for carrier-envelope offset ...
WebDec 15, 2001 · The frequency span observed at 1064 nm is converted to be about 1.4 THz at 532 nm, which is broad enough to cover all iodine lines within the tuning range of the … WebA 532 nm molecular iodine optical frequency standard based on modulation transfer spectroscopy* ... All three methods have been used to reproduce the 532 nm length standard, including JILA in the United States,[9,17,18]NMIJ in Japan,[19]PTB in Germany and ILP in Russia.[20]They use different methods to lock the laser to the R(56) 32-0:a10line ... WebMar 12, 2007 · The maximum frequency excursion at 532 nm is about 175 Hz during a continuous measuring time of 150 000 s Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 56 , Issue: 2 , April 2007 ) Article #: Page (s): 673 - 676 Date of Publication: 12 March 2007 ISSN Information: Print ISSN: 0018-9456 Electronic ISSN: … screenshot19.png